Parizat, A.: search on Z-Library

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1

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, CA (Monday 14 September 2009)] Photomask Technology 2009 - Mask inspection placement maps for improving overlay

Parizat, Ziv, Zurbrick, Larry S., Montgomery, M. Warren, de Kruif, Robert, Finders, Jo, Minnaert-Janssen, Ingrid, Duray, Frank, Ben Yishai, Michael, Mangan, Shmoolik, Cohen, Yaron, Englard, Ilan

Year:

2009

Language:

english

File:

PDF, 1.26 MB

english, 2009

2

Feminist Pedagogy: An Update || Three Poems

Parizat Tamang, Barbara Nimri and Barbara Soros

Journal:

Women's Studies Quarterly

Year:

1993

Language:

english

File:

PDF, 417 KB

english, 1993

3

Feminist Pedagogy || Three Poems

Parizat Tamang, Barbara Nimri Aziz and Barbara Soros

Journal:

Women's Studies Quarterly

Year:

1987

Language:

english

File:

PDF, 324 KB

english, 1987

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Metrology, Inspection, and Process Control for Microlithography XXIV - Scanner qualification with IntenCD based reticle error correction

Elblinger, Yair, Raymond, Christopher J., Finders, Jo, Demarteau, Marcel, Wismans, Onno, Minnaert Janssen, Ingrid, Duray, Frank, Ben Yishai, Michael, Mangan, Shmoolik, Cohen, Yaron, Parizat, Ziv, Atta

Year:

2010

Language:

english

File:

PDF, 2.69 MB

english, 2010

5

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XV - Yokohama, Japan (Wednesday 16 April 2008)] Photomask and Next-Generation Lithography Mask Technology XV - Practical application of aerial imaging mask inspection for memory devices

Baik, Hyun Joo, Horiuchi, Toshiyuki, Chung, Dong Hoon, Kim, Yong Hoon, Cho, Han Ku, Sagiv, Amir, Mangan, Shmoolik, Parizat, Ziv, Park, Eun Young, Brami, Yaniv, Bernstein, Dana

Year:

2008

Language:

english

File:

PDF, 657 KB

english, 2008

6

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 13 September 2010)] Photomask Technology 2010 - Feasibility study of EUV patterned mask inspection for the 22nm node

Bernstein, Dana, Montgomery, M. Warren, Maurer, Wilhelm, Park, Eun Young, Jaffe, Asaf, Shoshani, Nir, Parizat, Ziv, Mangan, Shmoolik, Han, Sang Hoon, Chung, Dong Hoon

Year:

2010

Language:

english

File:

PDF, 1.81 MB

english, 2010

7

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, CA (Monday 14 September 2009)] Photomask Technology 2009 - IntenCD technology for fast and accurate scanner performance determination

Parizat, Ziv, Zurbrick, Larry S., Montgomery, M. Warren, Finders, Jo, Demarteau, Marcel, Wissmans, Onno, Minaert Janssen, Ingrid, Duray, Frank, Ben Yishai, Michael, Mangan, Shmoolik, Cohen, Yaron, Elb

Year:

2009

Language:

english

File:

PDF, 2.93 MB

english, 2009

8

Testing an indirectly heated cathode ion source: Temperature and thermionic emission

Borges, C. F. M., Jerez, M. A., Parizat, A.

Journal:

Year:

2019

File:

PDF, 5.97 MB

2019

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